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Author:

Zhang, Yuefei (Zhang, Yuefei.) (Scholars:张跃飞) | Li, Yujie (Li, Yujie.) | Wang, Zhenyu (Wang, Zhenyu.) | Zhao, Kejie (Zhao, Kejie.)

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EI Scopus SCIE PubMed

Abstract:

Surface passivation has become a routine strategy of design to mitigate the chemomechanical degradation of high-capacity electrodes by regulating the electrochemical process of lithiation and managing the associated deformation dynamics. Oxides are the prevalent materials used for surface coating. Lithiation of SiO2 leads to drastic changes in its electro-chemo-mechanical properties from an electronic insulator and a brittle material in its pure form to a conductor and a material sustainable of large deformation in the lithiated form. We synthesized SiO2-coated SiC nanowires that allow us to focus on the lithiation behavior of the sub-10 nm SiO2 thin coating. We systematically investigate the structural evolution, the electronic conduction and ionic transport properties, and the deformation pattern of lithiated SiO2 through coordinated in situ transmission electron microcopy experiments, first-principles computation, and continuum theories. We observe the stress-mediated reaction that induces inhomogeneous growth of SiO2. The results provide fundamental perspectives on the chemomechanical behaviors of oxides used in the surface coating of Li-ion technologies.

Keyword:

Li-ion batteries core-shell oxides Surface coating stress

Author Community:

  • [ 1 ] [Zhang, Yuefei]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Li, Yujie]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Zhenyu]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 4 ] [Zhao, Kejie]Purdue Univ, Sch Mech Engn, W Lafayette, IN 47906 USA

Reprint Author's Address:

  • [Zhao, Kejie]Purdue Univ, Sch Mech Engn, W Lafayette, IN 47906 USA

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Source :

NANO LETTERS

ISSN: 1530-6984

Year: 2014

Issue: 12

Volume: 14

Page: 7161-7170

1 0 . 8 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:202

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 118

SCOPUS Cited Count: 122

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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