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Author:

Yuan, Xiaokun (Yuan, Xiaokun.) | Rohrer, Gregory S. (Rohrer, Gregory S..) | Song, Xiaoyan (Song, Xiaoyan.) (Scholars:宋晓艳) | Chien, Harry (Chien, Harry.) | Li, Jia (Li, Jia.) | Wei, Chongbin (Wei, Chongbin.)

Indexed by:

EI Scopus SCIE

Abstract:

Grain boundary plane distributions have been measured for Sigma 2 grain boundaries (boundaries that have a 90 degree rotation about the [10-10] axis) in undeformed and plastically deformed WC-Co cemented carbides. By virtue of electron backscattered diffraction data coupled with the five parameter analysis method, the measurements show that while the misorientations of the Sigma 2 boundaries are 20% reduced by the plastic deformation, there are 33% reduction in the orientation of the Sigma 2 twist grain boundary plane. A dislocation model for grain boundary plane reorientation during plastic deformation is proposed. (C) 2014 Elsevier Ltd. All rights reserved.

Keyword:

Cemented carbide Grain boundary plane distribution Plastic deformation Sigma 2 grain boundary Five parameter analysis Electron backscattered diffraction

Author Community:

  • [ 1 ] [Yuan, Xiaokun]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Song, Xiaoyan]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Rohrer, Gregory S.]Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
  • [ 4 ] [Chien, Harry]Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
  • [ 5 ] [Li, Jia]Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
  • [ 6 ] [Wei, Chongbin]Zhuzhou Cemented Carbide Cutting Tools Co Ltd, Zhuzhou 412007, Peoples R China

Reprint Author's Address:

  • [Yuan, Xiaokun]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing 100124, Peoples R China

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Source :

INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS

ISSN: 0263-4368

Year: 2014

Volume: 47

Page: 38-43

3 . 6 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:341

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 14

SCOPUS Cited Count: 14

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

Online/Total:436/10629051
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