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Abstract:
di/dt缓冲电路中较高的开通电感使IGBT短路特性在两种短路模式下有明显的不同,由于短路开通时集电极-发射极电压的急剧减小,IGBT短路模式一中的特性变得格外重要,而且还引起VCE变陡峭的去饱和过程。本文描述了该失效模式中IGBT特性,并给出了快速检测这种失效的两种备选方案。利用大面积高压压封IGBT模块及单IGBT芯片进行验证测试。
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Source :
电源世界
Year: 2013
Issue: 06
Page: 32-35
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 8
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