Indexed by:
Abstract:
证明了基于惯量矩的d维单位球面上样本服从均匀分布的基本特征,得到球面均匀分布协差阵特征根估计的强相合性及渐近多元正态性.提出了检验球面上样本均匀性的渐近卡方统计量,证明了拟合优度检验的相合性并做检验功效的随机模拟.
Keyword:
Reprint Author's Address:
Email:
Source :
应用数学学报
Year: 2009
Issue: 01
Volume: 32
Page: 93-105
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 7
Affiliated Colleges: