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Author:

Ye, Rendao (Ye, Rendao.) | Ma, Tiefeng (Ma, Tiefeng.) | Wang, Songgui (Wang, Songgui.)

Indexed by:

Scopus SCIE

Abstract:

In this paper, we consider the interval estimation problem on the process capability indices in general random effect model with balanced data. The confidence intervals for three commonly used process capability indices are developed by using the concept of generalized confidence interval. Furthermore, some simulation results on the coverage probability and expected value of the generalized lower confidence limits are reported. The simulation results indicate that the proposed confidence intervals do provide quite satisfactory coverage probabilities.

Keyword:

Lower specification limit Generalized confidence interval Process capability index Upper specification limit

Author Community:

  • [ 1 ] [Ye, Rendao]Hangzhou Dianzi Univ, Coll Business, Hangzhou, Zhejiang, Peoples R China
  • [ 2 ] [Wang, Songgui]Beijing Univ Technol, Coll Appl Sci, Beijing, Peoples R China

Reprint Author's Address:

  • [Ye, Rendao]Hangzhou Dianzi Univ, Coll Business, Hangzhou, Zhejiang, Peoples R China

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Related Keywords:

Source :

STATISTICAL PAPERS

ISSN: 0932-5026

Year: 2011

Issue: 1

Volume: 52

Page: 153-169

1 . 3 0 0

JCR@2022

ESI Discipline: MATHEMATICS;

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

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