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Author:

吴坚 (吴坚.) | 古冬冬 (古冬冬.) | 任艺 (任艺.)

Indexed by:

CQVIP PKU CSCD

Abstract:

光谱微检测技术是微全分析系统(μ-TAS)生化芯片的常用核心技术之一.对国内外相关文献进行分析表明,"功能集成与结构缩微"技术是当前μ-TAS领域对光谱微检测提出的迫切要求.对"集成与缩微"方面研究现状进行了综述,并对与此有关的激光微技术研究作了展望.

Keyword:

光谱检测 功能集成结构缩微 计量学 微型全分析系统

Author Community:

  • [ 1 ] [吴坚]北京工业大学
  • [ 2 ] [古冬冬]北京工业大学
  • [ 3 ] [任艺]北京工业大学

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Source :

计量学报

ISSN: 1000-1158

Year: 2008

Issue: z1

Volume: 29

Page: 222-225

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 11

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