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Abstract：
A non-destructive method for measuring the thickness of thin amorphous films composed of light elements has been developed. The method employs the statistics of the phase of the electron exit wave function. The accuracy of this method has been checked numerically by the multislice method and compared with that based on the mean inner potential. (C) 2008 Elsevier B.V. All rights reserved.
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ULTRAMICROSCOPY
ISSN： 0304-3991
Year： 2008
Issue： 12
Volume： 108
Page： 1616-1622
2 . 2 0 0
JCR@2022
ESI Discipline： CHEMISTRY;
JCR Journal Grade：1
Cited Count：
WoS CC Cited Count： 4
SCOPUS Cited Count： 4
ESI Highly Cited Papers on the List： 0 Unfold All
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30 Days PV： 0
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