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Abstract:
通过对热丝辅助微波电子回旋共振(HW-MW-ECRCVD)法制备的氢化非晶硅(a-Si:H)薄膜进行暗电导与温度关系的测试,可得到暗电导激活能(Ea),并研究了Ea与a-Si:H薄膜光敏性(σph/σ d)的关系;发现随着Ea的增大,费米能级位置下移,缺陷态密度减少,薄膜的光敏性变好.
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功能材料
ISSN: 1001-9731
Year: 2004
Issue: z1
Volume: 35
Page: 432-433
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 2
Chinese Cited Count:
30 Days PV: 6
Affiliated Colleges: