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Author:

Mao, SC (Mao, SC.) (Scholars:毛圣成) | Han, XD (Han, XD.) (Scholars:韩晓东) | Luo, JF (Luo, JF.) | Zhang, Z (Zhang, Z.)

Indexed by:

EI Scopus SCIE

Abstract:

Electron backscattering diffraction (EBSD) investigations were carried out on three ultra-thin TiNi rolling sheet samples with thickness of 0.15, 0.2 and 0.3 mm, respectively. The microstructure and texture evolution were investigated as a function of the sheet thickness. The automated EBSD system allows integrating the grain boundary, grain size and the preferred orientation information to be revealed simultaneously. By ODF analysis, the preferred orientations are revealed as {111} <0<(1)over bar>1>, {223} <0<(2)over bar>1>, and {332} <1<(1)over bar>0> in the three TiNi sheets. The {111} <0<(1)over bar>1> component evolves stronger with reducing the thickness of the rolling sheet. (C) 2005 Elsevier B.V. All rights reserved.

Keyword:

TiNi EBSD preferred orientation grain boundary

Author Community:

  • [ 1 ] Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100022, Peoples R China
  • [ 2 ] Beijing Univ Technol, Coll Appl Math & Phys, Beijing 100022, Peoples R China

Reprint Author's Address:

  • 韩晓东

    [Han, XD]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100022, Peoples R China

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Source :

MATERIALS LETTERS

ISSN: 0167-577X

Year: 2005

Issue: 28

Volume: 59

Page: 3567-3571

3 . 0 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 17

SCOPUS Cited Count: 17

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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