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Author:

郑祥明 (郑祥明.) | 王维斌 (王维斌.) | 史耀武 (史耀武.)

Indexed by:

CQVIP CSCD

Abstract:

分析了影响胶接接头耐久性的几个重要因素,并指出水对接头的弱化是影响其耐久性的最主要因素.同时,通过对几种超声法及振动法检测胶接接头耐久性的研究结果的对比看出,对于胶接接头耐久性的可靠评价必须建立在进一步研究退化机理及精确模型和探索对接头退化敏感的超声方法基础上.

Keyword:

耐久性 胶接接头 超声波 无损评价

Author Community:

  • [ 1 ] [郑祥明]北京工业大学
  • [ 2 ] [王维斌]北京工业大学
  • [ 3 ] [史耀武]北京工业大学

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Source :

甘肃工业大学学报

ISSN: 1673-5196

Year: 2002

Issue: 4

Volume: 28

Page: 43-47

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: 14

Chinese Cited Count:

30 Days PV: 11

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