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Abstract：
Transmission electron microscopy is used to investigate the structural characteristics of epitaxial ZnO thin films grown on (LaAlO3)(0.3)(Sr0.5Ta0.5O3)(0.7)(111) (LSAT) by rf plasma-assisted molecular beam epitaxy. It is found that the growth temperature plays a key role in the formation of microstructures in ZnO film. Growth temperature dependence of rotation domain, interface and dislocation structures is studied, and the mechanism for polarity selection is discussed. (c) 2005 Elsevier B.V. All rights reserved.
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PHYSICS LETTERS A
ISSN： 0375-9601
Year： 2005
Issue： 6
Volume： 339
Page： 497-502
2 . 6 0 0
JCR@2022
ESI Discipline： PHYSICS;
JCR Journal Grade：2
Cited Count：
WoS CC Cited Count： 8
SCOPUS Cited Count： 8
ESI Highly Cited Papers on the List： 0 Unfold All
WanFang Cited Count：
Chinese Cited Count：
30 Days PV： 8
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