Indexed by：
Abstract：
In order to provide good experimental environment for insulated gate bipolar transistor (IGBT) and solve its junction temperature measurement problem in the power cycle system, the IGBT pre-threshold voltage is used as a temperature sensitive parameter in this paper. The experimental platform is built based on FPGA as a control core unit to realize multi-channel IGBT junction temperature. Considering the influence of IGBT trailing current, according to the different operating currents of the device, the optimal turn-off duration corresponding to each operating current is determined to reduce the influence of turn-off duration on the normal operation of the device. The experimental results show that determining reasonable turn-off duration can effectively measure IGBT junction temperature and improve the efficiency of the system.
Keyword：
Reprint Author's Address：
Email：
Source ：
2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)
Year： 2018
Page： 338-340
Language： English
Cited Count：
WoS CC Cited Count： 0
SCOPUS Cited Count：
ESI Highly Cited Papers on the List： 0 Unfold All
WanFang Cited Count：
Chinese Cited Count：
30 Days PV： 3
