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Author:

Guo, Min (Guo, Min.) | Wang, Rui (Wang, Rui.)

Indexed by:

CPCI-S

Abstract:

Along with the rapid development of computer technology and digital image processing, traditional PCB technology of defect detection could not meet the demand of the quality of PCB, meanwhile AOI has received increasing attention. This paper mainly introduces the AOI machine based on PCB defect detection, hardware structure and software system is respectively carried on the design. In addition, provide a new method of defect detection which is based on the comparison of contour and introduce the process of camera calibration chiefly.

Keyword:

defect detection PCB AOI camera calibration

Author Community:

  • [ 1 ] [Guo, Min]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Rui]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Guo, Min]Beijing Key Lab Computat Intelligence & Intellige, Beijing 100124, Peoples R China
  • [ 4 ] [Wang, Rui]Beijing Key Lab Computat Intelligence & Intellige, Beijing 100124, Peoples R China
  • [ 5 ] [Guo, Min]Minist Educ, Engn Res Ctr Digital Commun, Beijing 100124, Peoples R China
  • [ 6 ] [Wang, Rui]Minist Educ, Engn Res Ctr Digital Commun, Beijing 100124, Peoples R China
  • [ 7 ] [Guo, Min]Beijing Lab Urban Mass Transit, Beijing 100124, Peoples R China
  • [ 8 ] [Wang, Rui]Beijing Lab Urban Mass Transit, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Wang, Rui]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China;;[Wang, Rui]Beijing Key Lab Computat Intelligence & Intellige, Beijing 100124, Peoples R China;;[Wang, Rui]Minist Educ, Engn Res Ctr Digital Commun, Beijing 100124, Peoples R China;;[Wang, Rui]Beijing Lab Urban Mass Transit, Beijing 100124, Peoples R China

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Source :

PROCEEDINGS OF THE 2016 INTERNATIONAL FORUM ON MANAGEMENT, EDUCATION AND INFORMATION TECHNOLOGY APPLICATION

ISSN: 2352-5398

Year: 2016

Volume: 47

Page: 767-770

Language: English

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 10

Online/Total:478/10587481
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