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Author:

Feng, RuiRui (Feng, RuiRui.) | Xie, XueSong (Xie, XueSong.) | Meng, Ju (Meng, Ju.) | Tian, Ce (Tian, Ce.) | Zhang, YiNan (Zhang, YiNan.)

Indexed by:

CPCI-S

Abstract:

SiC rectifier diodes are important components in the power electronics industry because they have advantages over conventional silicon diodes, including large currents, high operation temperatures, and other similar properties. In the devices' current voltage characteristics, it is readily observable that the curves at different temperatures have a common cross-over point. We found that the temperature dependence of the ohmic contact resistance may explain this behavior. To verify this, we constructed a simple model, which demonstrated that this phenomenon is caused by the proportional relationship between resistance and temperature.

Keyword:

Ohmic contact resistance I-V-T characteristics power SiC diode

Author Community:

  • [ 1 ] [Feng, RuiRui]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 2 ] [Xie, XueSong]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 3 ] [Meng, Ju]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 4 ] [Tian, Ce]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China
  • [ 5 ] [Zhang, YiNan]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Xie, XueSong]Beijing Univ Technol, Coll Microelect, Beijing 100124, Peoples R China

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Source :

2016 13TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)

Year: 2016

Page: 1239-1241

Language: English

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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