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Author:

Wang Yunxin (Wang Yunxin.) (Scholars:王云新) | Wang Dayong (Wang Dayong.) (Scholars:王大勇) | Yang, Dengcai (Yang, Dengcai.) | Ouyang Liting (Ouyang Liting.) | Jie, Zhao (Jie, Zhao.) | Panezai, Spozmai (Panezai, Spozmai.)

Indexed by:

CPCI-S EI Scopus

Abstract:

The quality of the microfluidic chip will influence the separations, injections, reactions and measurements of samples in the microfluidic system, it is essential to detect the structure such as the width, depth and roughness for evaluating its performance. Aiming at this requirement, digital holography microscope method is developed to achieve the quantitative, non-contact phase imaging with the full field. Firstly, the digital image plane holographic microscopy is designed, and the complex amplitude of the whole wave field is reconstructed by the angular spectrum method. The two-step phase subtraction and surface fitting methods are combined to eliminate the phase aberration, and the unwrapped phase information is extracted using the least-squares phase-unwrapping algorithm. Meanwhile, we acquire the profile parameters of the microchannel using white light interferometer, and the results demonstrate that the digital image plane holographic microscopy is feasible and effective for the profile measurement of microchannels in the microfluidic chip.

Keyword:

phase imaging microfluidic chip image plane holography digital holography

Author Community:

  • [ 1 ] [Wang Yunxin]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 2 ] [Wang Dayong]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 3 ] [Yang, Dengcai]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 4 ] [Ouyang Liting]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 5 ] [Panezai, Spozmai]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China
  • [ 6 ] [Wang Yunxin]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Wang Dayong]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 8 ] [Yang, Dengcai]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 9 ] [Ouyang Liting]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 10 ] [Panezai, Spozmai]Beijing Univ Technol, Inst Informat Photon Technol, Beijing 100124, Peoples R China
  • [ 11 ] [Jie, Zhao]Pilot Coll Beijing Univ Technol, Beijing 101101, Peoples R China

Reprint Author's Address:

  • 王云新

    [Wang Yunxin]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China

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Source :

6TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: DESIGN, MANUFACTURING, AND TESTING OF SMART STRUCTURES, MICRO- AND NANO- OPTICAL DEVICES, AND SYSTEMS

ISSN: 0277-786X

Year: 2012

Volume: 8418

Language: English

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

Affiliated Colleges:

Online/Total:376/10703022
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