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Author:

Liu, Xiaohei (Liu, Xiaohei.) | Xia, Zhidong (Xia, Zhidong.) | Yuan, Bo (Yuan, Bo.) | Zhao, Mengke (Zhao, Mengke.) | Guo, Fu (Guo, Fu.) (Scholars:郭福)

Indexed by:

CPCI-S

Abstract:

In this study, based on the conductive polymer filled with Ag-coated Cu dendritic powder (ACDP), Ag-coated glass fiber powder (AGFP) was selected as assistant filler to improve the conductive network. The results showed that the volume resistivity reached 0.004 Omega.cm when the total fillers were less than 70.6 wt%. The effect of the filler content of the AGFP powder on the conductivity, creep behavior of resistance and piezo-resistivity properties of the conductive polymer was studied. Under constant pressure, the resistance creep behavior of the conductive polymer showed that the volume resistivity decreased nonlinearly with time. When the pressure was applied within 0 similar to 2.0MPa, the conductivity variation of the conductive polymer exhibited a positive pressure coefficient of resistance (PPCR). However, the piezoresistance effect could be neglected with increasing filler content and applied pressure. In addition, the reliability of the conductive polymer under aging at 85oC and 85% relative humidity (RH) in a temperature/humidity chamber was discussed.

Keyword:

volume resistivity conductive polymer creep glass fiber reliability piezoresistance effect

Author Community:

  • [ 1 ] [Liu, Xiaohei]Beijing Univ Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Xia, Zhidong]Beijing Univ Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Yuan, Bo]Beijing Univ Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Zhao, Mengke]Beijing Univ Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Guo, Fu]Beijing Univ Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Liu, Xiaohei]Beijing Univ Technol, 100 Pingleyuan, Beijing 100124, Peoples R China

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Source :

2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP)

Year: 2011

Page: 237-241

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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