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Author:

Zhang Gaimei (Zhang Gaimei.) | Chen Qiang (Chen Qiang.) | He Cunfu (He Cunfu.) (Scholars:何存富) | Zhu Huiqin (Zhu Huiqin.) | Li Yuling (Li Yuling.)

Indexed by:

CPCI-S EI Scopus

Abstract:

The nano-thickness SiOx deposited on polyethylene terephthalate (PET) film and biaxially oriented polypropylene (BOPP) were fabricated by plasma enhanced chemical vapor deposition (PECVD) in a radio frequency (13.56 MHz) glow discharge. The nano-coatings were characterized by using Fourier transform infrared spectroscopy (FTIR), atomic force microscopy (AFM) and ultrasonic atomic force microscopy (UAFM). With AFM and UAFM, the topography and ultrasonic amplitude images were obtained. In particular, the UAFM images reveal the subsurface defects in the coating. The tensile property, contact angle and OTR of the PET present and absent of the SiOx coating were investigated experimentally respectively. The results can show that the SiOx coating can improved the barrier and the tensile strength.

Keyword:

Ultrasonic atomic force microscopy Barrier properties Characterization SiOx film

Author Community:

  • [ 1 ] [Zhang Gaimei]Beijing Inst Graph Commun, Lab Plasma Phys & Mat, Beijing, Peoples R China
  • [ 2 ] [Chen Qiang]Beijing Inst Graph Commun, Lab Plasma Phys & Mat, Beijing, Peoples R China
  • [ 3 ] [Zhu Huiqin]Beijing Inst Graph Commun, Lab Plasma Phys & Mat, Beijing, Peoples R China
  • [ 4 ] [Li Yuling]Beijing Inst Graph Commun, Lab Plasma Phys & Mat, Beijing, Peoples R China
  • [ 5 ] [Zhang Gaimei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 6 ] [He Cunfu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China

Reprint Author's Address:

  • [Zhang Gaimei]Beijing Inst Graph Commun, Lab Plasma Phys & Mat, Beijing, Peoples R China

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Related Keywords:

Source :

PRINTING AND PACKAGING STUDY

ISSN: 1022-6680

Year: 2011

Volume: 174

Page: 486-,

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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