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Author:

徐介平 (徐介平.)

Abstract:

本文将综述以Mason等效电路为基础的计算声光器件中压电换能器频率响应的理论,它对于声光器件中换能器的设计和性能测试是极重要的.本文将应用此理论对目前最重要的两种声光器件(36°Y切LN/PM和X切LN/TeO_2)以及各种镀层材料和厚度计算换能器捐耗TL随相对频率f/f_0的变化关系,由此可确定各镀层的厚度和器件的换能器带宽.本文还给出这两种器件的电输入阻抗Z_1在阻抗园图上随f/f_0变化的轨迹,它可作为器件性能测试的理论依据.

Keyword:

背电极 压电换能器 镀层厚度 换能器带宽 中介层 器件性能 声光器件

Author Community:

  • [ 1 ] 北京工业大学

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Source :

压电与声光

Year: 1979

Issue: 04

Page: 45-64

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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