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Author:

Feng, SW (Feng, SW.) (Scholars:冯士维) | Lu, CZ (Lu, CZ.) | Hu, J (Hu, J.) | Lu, YC (Lu, YC.) | Wynn, JD (Wynn, JD.) | Ghosh, C (Ghosh, C.)

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CPCI-S

Abstract:

The InP cap layer plays a significant role towards improving the performance of the InP/InGaAs p-i-n photodiode. However, the measurements and simulation confirm that it also induces wavelength-dependent absorption losses and a non-flat photo-responsivity curve due to the reflections from a multilayer structure.

Keyword:

Author Community:

  • [ 1 ] Beijing Univ Technol, Sch Elect Informat & Auto Control, Beijing 100022, Peoples R China

Reprint Author's Address:

  • 冯士维

    [Feng, SW]Beijing Univ Technol, Sch Elect Informat & Auto Control, Pingleyuan 100, Beijing 100022, Peoples R China

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Source :

2004: 7TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUITS TECHNOLOGY, VOLS 1- 3, PROCEEDINGS

Year: 2004

Page: 2332-2334

Language: English

Cited Count:

WoS CC Cited Count: 2

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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