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Author:

Ma, Wei (Ma, Wei.) | Zheng, Mana (Zheng, Mana.) | Ma, Wenguang (Ma, Wenguang.) | Xu, Shibiao (Xu, Shibiao.) | Zhang, Xiaopeng (Zhang, Xiaopeng.)

Indexed by:

EI Scopus SCIE

Abstract:

Stereo image completion (SIC) is to fill holes existing in a pair of stereo images. SIC is more complicated than single image repairing, which needs to complete the pair of images while keeping their stereoscopic consistency. In recent years, deep learning has been introduced into single image repairing but seldom used for SIC. The authors present a novel deep learning-based approach for SIC. In their method, an X-shaped fully convolutional network (called SICNet) is proposed and designed to complete stereo images, which is composed of two branches of convolutional neural network layers to encode the context of the left and right images separately, a fusion module for stereo-interactive completion, and two branches of decoders to produce completed left and right images, respectively. In consideration of both inter-view and intra-view cues, they introduce auxiliary networks and define comprehensive losses to train SICNet to perform single-view coherent and cross-view consistent completion simultaneously. Extensive experiments are conducted to show the state-of-the-art performances of the proposed approach and its key components. © The Institution of Engineering and Technology 2020

Keyword:

Stereo image processing Image reconstruction Convolutional neural networks Deep learning Multilayer neural networks Network layers Convolution

Author Community:

  • [ 1 ] [Ma, Wei]Faculty of Information Technology, Beijing University of Technology, No. 100 Pingleyuan Street, Chaoyang District, Beijing, China
  • [ 2 ] [Zheng, Mana]Faculty of Information Technology, Beijing University of Technology, No. 100 Pingleyuan Street, Chaoyang District, Beijing, China
  • [ 3 ] [Ma, Wenguang]Faculty of Information Technology, Beijing University of Technology, No. 100 Pingleyuan Street, Chaoyang District, Beijing, China
  • [ 4 ] [Xu, Shibiao]National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing; 100190, China
  • [ 5 ] [Zhang, Xiaopeng]National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing; 100190, China

Reprint Author's Address:

  • [xu, shibiao]national laboratory of pattern recognition, institute of automation, chinese academy of sciences, beijing; 100190, china

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Source :

IET Computer Vision

ISSN: 1751-9632

Year: 2020

Issue: 7

Volume: 14

Page: 482-492

1 . 7 0 0

JCR@2022

ESI Discipline: COMPUTER SCIENCE;

ESI HC Threshold:45

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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