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Author:

Qin, Fei (Qin, Fei.) | Zhao, Shuai (Zhao, Shuai.) | Dai, Yanwei (Dai, Yanwei.) (Scholars:代岩伟) | Hu, Yuankun (Hu, Yuankun.) | An, Tong (An, Tong.) | Gong, Yanpeng (Gong, Yanpeng.)

Indexed by:

EI Scopus SCIE

Abstract:

Mud-cracking of the sintered silver (Ag) layer of the SiC power module is commonly found during power cycling tests. In this article, the effect of the mud-cracking of sintered Ag on the heat transfer behaviors of SiC power module is studied based on a Voronoi tessellation model. This model is verified to be reasonable on the prediction of the equivalent thermal conductivity of sintered Ag as well as the thermal resistance of power module. The effect of the crack ratio on the equivalent thermal conductivity of sintered Ag is studied and an empirical model is proposed to predict the equivalent thermal conductivity of sintered Ag containing different mud-cracking ratios. The effect of mud-cracking ratio, chip size, sintered Ag thickness, and porosity on the thermal resistance of power module are studied. An equivalent model to study the heat transfer behaviors of the power module with mud-cracking is also developed to improve the calculation efficiency. This article establishes a new method to quantitively study the heat transfer behaviors of the power module under power cycling condition.

Keyword:

Geometry Conductivity Mathematical models sintered Ag Multichip modules Behavioral sciences Silicon carbide Voronoi model Heat transfer Mud-cracking porosity power cycling

Author Community:

  • [ 1 ] [Qin, Fei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Dai, Yanwei]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 3 ] [An, Tong]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Gong, Yanpeng]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Qin, Fei]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing 100124, Peoples R China
  • [ 6 ] [Zhao, Shuai]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing 100124, Peoples R China
  • [ 7 ] [Dai, Yanwei]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing 100124, Peoples R China
  • [ 8 ] [Hu, Yuankun]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing 100124, Peoples R China
  • [ 9 ] [An, Tong]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing 100124, Peoples R China
  • [ 10 ] [Gong, Yanpeng]Beijing Univ Technol, Fac Mat & Mfg, Inst Elect Packaging Technol & Reliabil, Beijing 100124, Peoples R China

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Source :

IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY

ISSN: 2156-3950

Year: 2022

Issue: 6

Volume: 12

Page: 964-972

2 . 2

JCR@2022

2 . 2 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:3

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 5

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