The　structural,　microstructural,　and　microwave　dielectric　properties　of　Ba1-xSrxTi4O9,　(0.0　＜=　x　＜=　0.06)　ceramics　samples　synthesized　by　a　conventional　route　were　investigated.　These　structural,　microstructural,　and　dielectric　properties　were　recorded　using　X-ray　diffraction　(XRD),　scanning　electron　microscopy　(SEM),　and　Fourier　transform　infrared　(FTIR)　and　impedance　analyzer　spectroscopies.　Ti-O　octahedral　distortion　was　observed　due　to　Sr2+　addition.　The　microwave　dielectric　properties　were　interrelated　with　various　Sr2+　concentrations.　Excellent　microwave　dielectric　properties,　i.e.,　high　relative　permittivity　(c(r)　=　71.50)　and　low　dielectric　loss　(tan　delta　=　0.0006),　were　obtained.