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Author:

Ma, Wenguang (Ma, Wenguang.) | Xu, Shibiao (Xu, Shibiao.) | Ma, Wei (Ma, Wei.) (Scholars:马伟) | Zhang, Xiaopeng (Zhang, Xiaopeng.) | Zha, Hongbin (Zha, Hongbin.)

Indexed by:

EI Scopus SCIE

Abstract:

Existing deep models for facade parsing often fail in classifying pixels in heavily occluded regions of facade images due to the difficulty in feature representation of these pixels. In this paper, we solve facade parsing with occlusions by progressive feature learning. To this end, we locate the regions contaminated by occlusions via Bayesian uncertainty evaluation on categorizing each pixel in these regions. Then, guided by the uncertainty, we propose an occlusion-immune facade parsing architecture in which we progressively re-express the features of pixels in each contaminated region from easy to hard. Specifically, the outside pixels, which have reliable context from visible areas, are re-expressed at early stages; the inner pixels are processed at late stages when their surroundings have been decontaminated at the earlier stages. In addition, at each stage, instead of using regular square convolution kernels, we design a context enhancement module (CEM) with directional strip kernels, which can aggregate structural context to re-express facade pixels. Extensive experiments on popular facade datasets demonstrate that the proposed method achieves state-of-the-art performance.

Keyword:

feature representation manmade structure Context modeling Convolutional neural networks Training Facade parsing Representation learning occlusion Uncertainty Buildings Bayes methods

Author Community:

  • [ 1 ] [Ma, Wenguang]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Ma, Wei]Beijing Univ Technol, Fac Informat Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Xu, Shibiao]Beijing Univ Posts & Telecommun, Sch Artificial Intelligence, Beijing 100876, Peoples R China
  • [ 4 ] [Zhang, Xiaopeng]Chinese Acad Sci, Inst Automat, Natl Lab Pattern Recognit, Beijing 100190, Peoples R China
  • [ 5 ] [Zha, Hongbin]Peking Univ, Sch Elect Engn & Comp Sci, Key Lab Machine Percept MOE, Beijing 100871, Peoples R China

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Source :

IEEE TRANSACTIONS ON IMAGE PROCESSING

ISSN: 1057-7149

Year: 2022

Volume: 31

Page: 2081-2093

1 0 . 6

JCR@2022

1 0 . 6 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 9

SCOPUS Cited Count: 9

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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