A　structured-light　projection　system　was　designed　for　microscale　objects　with　surface　heights　that　ranged　from　tens　to　hundreds　of　microns.　The　system　was　composed　of　a　universal　projector　and　microscope　system　that　supported　editing　the　attributes　of　structured-light　patterns　in　real-time　and　was　capable　of　projecting　microscale　patterns.　On　this　basis,　reconstructing　the　metal　surfaces　of　microscale　objects　based　on　grid　patterns　of　structured　light　was　investigated,　the　internal　and　external　parameters　of　microscope　vision　and　projection　systems　were　calibrated,　and　an　image　algorithm　for　grid-node　detection　was　designed.　The　results　indicated　that　the　proposed　method　successfully　reconstructed　the　three-dimensional　(3D)　surface　of　microscale　objects,　and　the　reconstruction　results　were　consistent　with　the　original　surfaces.　With　95%　confidence,　the　reconstruction　precision　in　the　X-　and　Y-directions　was　approximately　+/-　4.0　mu　m　and　in　the　Z-direction　was　approximately　+/-　7.5　mu　m.　The　designed　system　and　the　proposed　method　were　suitable　for　3D-shape　measurement　of　microstructures　in　microscopic　fields　and　can　be　adapted　to　meet　a　broader　range　of　applications,　as　compared　to　current　methods.