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Author:

Zhang, Q. (Zhang, Q..) | Deng, J.X. (Deng, J.X..) (Scholars:邓金祥) | Li, R.D. (Li, R.D..) | Luo, J.X. (Luo, J.X..) | Kong, L. (Kong, L..) | Meng, J.H. (Meng, J.H..) | Gao, H.L. (Gao, H.L..) | Yang, Q.Q. (Yang, Q.Q..) | Wang, G.S. (Wang, G.S..) | Wang, X.L. (Wang, X.L..) | Wang, J.Y. (Wang, J.Y..)

Indexed by:

EI Scopus SCIE

Abstract:

(BixGa1-x)2O3 films were prepared at 820 °C by sol-gel method, an ethylene glycol solution of hydrated gallium nitrate and bismuth nitrate stabilized by monoethanolamine, of which crystallization, surface morphology and electronic structure as well as optical properties were studied in detail by X-ray diffraction, Scanning electron microscope-energy dispersive spectrometer, Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy and Ultraviolet-visible spectroscopy. XRD showed Ga2O3 film prepared from solutions consisted of two crystal structures, β and γ, increasing Bi atoms into Ga2O3 that enable the inhibition of γ phase formation and (BixGa1-x)2O3 and Ga2O3 capable of holding the same monoclinic crystal structure. EDS displayed (BixGa1-x)2O3 films of varied compositions were obtained with content of different Bi atoms into the solution, which kept same monoclinic crystal as β-Ga2O3 when Bi ranged from 0 < x < 0.056. FTIR revealed that the absorption band below 480 cm−1 corresponded to the octahedral position of Ga2O3 and the Bi atoms in the (BixGa1-x)2O3 films substituted the Ga in the [GaO6] octahedron. XPS exhibited increasing Bi content raised Ga3+/Ga ratio. UV-VIS provided evidence that optical band gap of (BixGa1-x)2O3 down to 3.2 eV indicating Bi-doping achieved Ga2O3 band gap tunable, concurrently, the bowing parameter c = 1.83 eV was obtained on the basis of the fitting curve of band gap. [Figure not available: see fulltext.]. © 2022, The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature.

Keyword:

(BixGa1-x)2O3; Alloy; Band gap; Ga2O3; Sol-gel

Author Community:

  • [ 1 ] [Zhang, Q.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Deng, J.X.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Li, R.D.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Li, R.D.]Department of Basic Courses, Institute of Disaster Prevention, Hebei, 065201, China
  • [ 5 ] [Luo, J.X.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Kong, L.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 7 ] [Meng, J.H.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 8 ] [Gao, H.L.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 9 ] [Yang, Q.Q.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 10 ] [Wang, G.S.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 11 ] [Wang, X.L.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China
  • [ 12 ] [Wang, J.Y.]College of Applied Sciences, Beijing University of Technology, Beijing, 100124, China

Reprint Author's Address:

  • 邓金祥

    [Deng, J.X.]College of Applied Sciences, China

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Source :

Journal of Sol-Gel Science and Technology

ISSN: 0928-0707

Year: 2022

Issue: 1

Volume: 103

Page: 280-289

2 . 5

JCR@2022

2 . 5 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:66

JCR Journal Grade:1

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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