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Author:

Wu, Shao-Dong (Wu, Shao-Dong.) | Shang, De-Guang (Shang, De-Guang.) (Scholars:尚德广) | Zuo, Lin-Xuan (Zuo, Lin-Xuan.) | Qu, Lin-Feng (Qu, Lin-Feng.) | Hou, Geng (Hou, Geng.) | Hao, Guo-Cheng (Hao, Guo-Cheng.) | Shi, Feng-Tian (Shi, Feng-Tian.)

Indexed by:

EI Scopus SCIE

Abstract:

The experimental results show that needled C/SiC composite exhibits nonlinear stiffness characteristics in the process of vibration. In order to consider the effect of the number of fiber layers on the fatigue properties, the S-N curve related to the number of 0 degrees layer fibers for needled C/SiC composite is proposed in this investigation. According to the relationship between the frequency response curve and the signal strength, an amplitude probability density function under narrow band random vibrations was proposed for predicting the fatigue life for the notched plate specimen. The results showed that the proposed method has a good prediction effect.

Keyword:

Rayleigh model Needled C SiC composite Random vibration Vibration fatigue life S-N curve

Author Community:

  • [ 1 ] [Wu, Shao-Dong]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 2 ] [Shang, De-Guang]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 3 ] [Hou, Geng]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 4 ] [Hao, Guo-Cheng]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 5 ] [Shi, Feng-Tian]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 6 ] [Zuo, Lin-Xuan]Aviat Ind Corp China Ltd, Shenyang Aircraft Design & Res Inst, Shenyang 110035, Peoples R China
  • [ 7 ] [Qu, Lin-Feng]Aviat Ind Corp China Ltd, Shenyang Aircraft Design & Res Inst, Shenyang 110035, Peoples R China

Reprint Author's Address:

  • [Shang, De-Guang]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China;;

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Source :

INTERNATIONAL JOURNAL OF FATIGUE

ISSN: 0142-1123

Year: 2023

Volume: 168

6 . 0 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:26

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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