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Author:

Liu, Zenghua (Liu, Zenghua.) (Scholars:刘增华) | Feng, Xuejian (Feng, Xuejian.) | Ren, Jie (Ren, Jie.) | Wang, Shuangquan (Wang, Shuangquan.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.)

Indexed by:

EI PKU CSCD

Abstract:

It is difficult to realize the quantitative detection of defects by using the time domain or frequency domain features of Lamb wave signals due to their dispersion and multi-mode characteristics. This paper proposes a method for analyzing the propagation characteristics of laser-induced Lamb waves in frequency-wavenumber domain. Based on a full-optical laser ultrasonic testing system, time-space wavefield signals were obtained by the pulse laser excitation in a fixed location and continuous laser acquisition with one-dimensional scanning, where the propagation characteristics of laser-induced Lamb wave signals and the regular pattern of the interaction between the laser-induced Lamb wave signal and the defect can be visually displayed. The two-dimensional Fourier transform was used to convert the wavefield signals from the time-space domain to the frequency-wavenumber domain where individual modes including in the signals are well discernible. Based on the idea of short-time Fourier transform, for retaining the space information, a short-space two-dimensional Fourier transform was adopted to obtain the distribution of wavenumber along the scanning path, by which the location of the defect can be visually displayed. The results of short-space two-dimensional Fourier transform were optimized by using band-pass filtering combined with continuous wavelet transform. The experiments performed on pristine and defected aluminum plates respectively confirm the effectiveness of the method. © 2019, Editorial Office of Journal of Vibration and Shock. All right reserved.

Keyword:

Fourier series Surface waves Wavelet transforms Frequency domain analysis Ultrasonic waves Defects Laser excitation Ultrasonic testing Time domain analysis

Author Community:

  • [ 1 ] [Liu, Zenghua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Liu, Zenghua]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Feng, Xuejian]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Feng, Xuejian]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Ren, Jie]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Ren, Jie]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 7 ] [Wang, Shuangquan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 8 ] [Wang, Shuangquan]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 9 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 10 ] [He, Cunfu]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China
  • [ 11 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 12 ] [Wu, Bin]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing; 100124, China

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Source :

Journal of Vibration and Shock

ISSN: 1000-3835

Year: 2019

Issue: 22

Volume: 38

Page: 70-78

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 12

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