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Author:

Yang, Gangli (Yang, Gangli.) | Li, Xiaoyan (Li, Xiaoyan.) (Scholars:李晓延) | Han, Xu (Han, Xu.) | Li, Shanshan (Li, Shanshan.)

Indexed by:

EI Scopus SCIE

Abstract:

Purpose This study aims to analyse the changes in the microstructure and grain orientation of the full Cu3Sn solder joint (Cu/Cu3Sn/Cu) during isothermal aging at 420 degrees C. Design/methodology/approach The Cu3Sn solder joint was fabricated through soldering Cu/Sn/Cu structure and then aged at 420 degrees C. The microstructure evolution and grain orientation were studied by observing the cross-section and top-view surfaces of solder joints. Findings Original Cu3Sn solder joint initially transformed into the full Cu(41)Sn(11)solder joint (Cu/Cu41Sn11/Cu) at 10 h and finally into the full alpha(Cu) solder joint (Cu/alpha(Cu)/Cu) at 150 h during aging. Micro-voids formed in the center of the solder joint interface during the conversion of Cu(41)Sn(11)to alpha(Cu), resulting in lower reliability of the solder joint. Cu3Sn and Cu41Sn11 grains presented a column-like shape, while alpha(Cu) presented an irregular shape. The average grain sizes of interfacial phases first increased and then decreased during aging. Original Cu3Sn solder joint exhibited two main textures: [100]//TD and [203]//TD. For Cu41Sn11, the preferred orientation of [111]//TD was found in the early nucleation stage, while the orientation of the formed full Cu41Sn11 solder joint was dispersed. Furthermore, alpha(Cu) grains exhibited {100} preferred orientation. Originality/value Few researchers focused on the process of microstructure and grain orientation changes during high-temperature (> 300 degrees C) aging of Cu3Sn solder joint. To bridge the research gap, a high-temperature aging experiment was conducted on Cu3Sn solder joints.

Keyword:

Thermal aging Grain orientation Microstructure evolution Electronic packaging Cu3Sn solder joint IMC

Author Community:

  • [ 1 ] [Yang, Gangli]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 2 ] [Li, Xiaoyan]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 3 ] [Han, Xu]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China
  • [ 4 ] [Li, Shanshan]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China

Reprint Author's Address:

  • [Li, Xiaoyan]Beijing Univ Technol, Coll Mat Sci & Engn, Beijing, Peoples R China;;

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Source :

SOLDERING & SURFACE MOUNT TECHNOLOGY

ISSN: 0954-0911

Year: 2022

Issue: 1

Volume: 35

Page: 44-50

2 . 0

JCR@2022

2 . 0 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

Affiliated Colleges:

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