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Author:

Duan, Li-Juan (Duan, Li-Juan.) (Scholars:段立娟) | Wu, Chun-Li (Wu, Chun-Li.) | En, Qing (En, Qing.) | Qiao, Yuan-Hua (Qiao, Yuan-Hua.) (Scholars:乔元华) | Zhang, Yun-Dong (Zhang, Yun-Dong.) | Chen, Jun-Cheng (Chen, Jun-Cheng.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

Single Image Super Resolution (SISR) refers to the reconstruction of high resolution images from a low resolution image. Traditional neural network methods typically perform super-resolution reconstruction in the spatial domain of an image, but these methods often ignore important details in the reconstruction process. In view of the fact that wavelet transform can separate the 'rough' and 'detail' features of image content, this study proposes a wavelet-based deep residual network (DRWSR). Different from other traditional convolutional neural networks, the high-resolution image (HR) is directly derived. This method uses a multi-stage learning strategy to first infer the wavelet coefficients corresponding to the high-resolution image and then reconstruct the super-resolution image (SR). In order to obtain more information, the method uses a flexible and scalable deep neural network with residual nested residuals. In addition, the proposed neural network model is optimized by combining the loss function of image space and wavelet domain. The proposed method is carried out on Set5, Set14, BSD100, Urban100, and other datasets. The experimental results show that the proposed visual effect and peak signal-to-noise ratio (PNSR) are better than the related image super-resolution method. © Copyright 2019, Institute of Software, the Chinese Academy of Sciences. All rights reserved.

Keyword:

Wavelet transforms Convolution Signal to noise ratio Image reconstruction Deep neural networks Convolutional neural networks Optical resolving power Learning systems

Author Community:

  • [ 1 ] [Duan, Li-Juan]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Duan, Li-Juan]Beijing Key Laboratory of Trusted Computing, Beijing; 100124, China
  • [ 3 ] [Duan, Li-Juan]National Engineering Laboratory for Key Technologies of Information Security Level Protection, Beijing; 100124, China
  • [ 4 ] [Wu, Chun-Li]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Wu, Chun-Li]Beijing Key Laboratory of Trusted Computing, Beijing; 100124, China
  • [ 6 ] [Wu, Chun-Li]National Engineering Laboratory for Key Technologies of Information Security Level Protection, Beijing; 100124, China
  • [ 7 ] [En, Qing]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 8 ] [En, Qing]Beijing Key Laboratory of Trusted Computing, Beijing; 100124, China
  • [ 9 ] [En, Qing]National Engineering Laboratory for Key Technologies of Information Security Level Protection, Beijing; 100124, China
  • [ 10 ] [Qiao, Yuan-Hua]College of Applied Science, Beijing University of Technology, Beijing; 100124, China
  • [ 11 ] [Zhang, Yun-Dong]State Key Laboratory of Digital Multimedia Chip Technology (Vimicro Corp.), Beijing; 100191, China
  • [ 12 ] [Chen, Jun-Cheng]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • [chen, jun-cheng]faculty of information technology, beijing university of technology, beijing; 100124, china

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Source :

Journal of Software

ISSN: 1000-9825

Year: 2019

Issue: 4

Volume: 30

Page: 941-953

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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