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Author:

Han, H. (Han, H..) | Sun, M. (Sun, M..) | Li, F. (Li, F..) | Liu, Z. (Liu, Z..) | Wang, C. (Wang, C..)

Indexed by:

EI Scopus SCIE

Abstract:

In wastewater treatment process (WWTP), abnormal data seriously reduce data quality rendering the application techniques impractical. The implementation of abnormal data detection is challenging due to the nonlinear nature of WWTP. Typically, constructing an accurate anomaly detector requires large amounts of labeled data, which is difficult in practice. Thus, a self-supervised memory enhanced deep clustering method (SMEL) is proposed to detect abnormal data without using any labels. First, a self-supervised deep clustering network, combining stacked autoencoders and the clustering algorithm, leverages unlabeled data to extract nonlinear features and capture the normal pattern. Second, an adaptive weight objective function, jointly optimizing the reconstruct error and clustering error, is designed to obtain a robust clustering structure. Third, double memory enhanced modules, consisting of a centroid memory and a score memory, are presented to enhance training stability and detection accuracy. Finally, experiments on three WWTP datasets show that SMEL achieves the highest detection accuracy. IEEE

Keyword:

Deep learning Wastewater treatment Wastewater treatment process adaptive weight objective function Clustering methods double memory enhanced modules abnormal data detection Training Data models self-supervised deep clustering network Feature extraction Linear programming

Author Community:

  • [ 1 ] [Han H.]Faculty of Information Technology, the Beijing Key Laboratory of Computational Intelligence and Intelligent System, and the Engineering Research Center of Digital Community, Ministry of Education, Beijing University of Technology, Beijing, China
  • [ 2 ] [Sun M.]Faculty of Information Technology and Beijing Key Laboratory of Computational Intelligence and Intelligent System, Beijing University of Technology, Beijing, China
  • [ 3 ] [Li F.]Faculty of Information Technology and Beijing Key Laboratory of Computational Intelligence and Intelligent System, Beijing University of Technology, Beijing, China
  • [ 4 ] [Liu Z.]Beijing Aerospace Smart Manufacturing Technology Development Co., Ltd, China
  • [ 5 ] [Wang C.]Beijing Aerospace Smart Manufacturing Technology Development Co., Ltd, China

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Source :

IEEE Transactions on Industrial Informatics

ISSN: 1551-3203

Year: 2023

Issue: 2

Volume: 20

Page: 1-11

1 2 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:19

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 7

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 13

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