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Author:

Zhang, Hu (Zhang, Hu.) | Zhou, Wei (Zhou, Wei.) | Ji, Xiaoliang (Ji, Xiaoliang.) | Li, Xiaoyan (Li, Xiaoyan.)

Indexed by:

EI Scopus SCIE

Abstract:

Herein, it was investigated the growth kinetics, grain orientation, and mechanical properties of the Cu20Sn6 phase aged from full Cu3Sn joints at the aging temperatures of 600, 620, and 640 °C. The results showed that the growth mechanism of the Cu20Sn6 phase was dominated by bulk diffusion. Furthermore, the activation energy of Q and the growth rate constant of k0 were respectively 45.25 kJ/mol and 3.6 × 104 µm2/min for the Cu20Sn6 phase. Besides, although the preferred orientation of the Cu20Sn6 was not very obvious, it was [0001] direction in parallel to the diffusion direction. And, in ND, the [010]Cu3Sn was parallel to the [01–11]Cu20Sn6 and [11–21]Cu20Sn6. Based on the nanoindentation results, the average hardness of Cu3Sn and Cu20Sn6 phase was approximately 7.12 ± 0.12 GPa and 8.69 ± 0.47 GPa, while the corresponding Young’s moduli were 143.80 ± 4.51 GPa and 166.43 ± 7.32 GPa. Consequently, the Cu20Sn6 phase had a better performance on hardness and Young’s moduli than Cu3Sn. Last but not least, the shearing strength for the soldering joints increased from 35.71 to 60.77 MPa with increasing aging time. The fracture mechanism of Cu3Sn was an intergranular fracture, while it was a cleavage fracture for Cu20Sn6. Furthermore, the fracture mechanism presented a mixed fracture of intergranular and transgranular fracture when the joints consisted of Cu3Sn and Cu20Sn6. © 2023, The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature.

Keyword:

Lead-free solders Hardness Tin alloys Silver alloys Binary alloys Growth rate Brittle fracture Activation energy Grain growth Textures Soldering Rate constants Growth kinetics Copper alloys

Author Community:

  • [ 1 ] [Zhang, Hu]College of Materials Science and Engineering, Beijing University of Technology, No. 100 Ping Le Yuan, Chaoyang District, Beijing; 100124, China
  • [ 2 ] [Zhou, Wei]College of Materials Science and Engineering, Beijing University of Technology, No. 100 Ping Le Yuan, Chaoyang District, Beijing; 100124, China
  • [ 3 ] [Ji, Xiaoliang]College of Materials Science and Engineering, Beijing University of Technology, No. 100 Ping Le Yuan, Chaoyang District, Beijing; 100124, China
  • [ 4 ] [Li, Xiaoyan]College of Materials Science and Engineering, Beijing University of Technology, No. 100 Ping Le Yuan, Chaoyang District, Beijing; 100124, China

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Source :

Journal of Materials Science: Materials in Electronics

ISSN: 0957-4522

Year: 2023

Issue: 16

Volume: 34

2 . 8 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:26

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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