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Author:

Li, Yingchun (Li, Yingchun.) | Ma, Ye (Ma, Ye.) | Peng, Rui (Peng, Rui.) | Gao, Kaiye (Gao, Kaiye.)

Indexed by:

CPCI-S

Abstract:

Most software reliability models have focused on merely fault detection process, and ignored the time delay for correcting the detected faults. Some recent works considering both fault detection process and correction process are proposed, mainly based on the Non-homogeneous Poisson Process. However, the analytical models are usually developed based on some specific assumptions on the fault occurrence time distribution, time delay distribution, etc. Differently, this paper proposes the time series analysis model for predicting both the detected number of faults and corrected number of faults during software testing process. Real dataset is used to illustrate the approach.

Keyword:

time serics mode software reliability growth model fault detection process (FDP) Fault correction process (FCP)

Author Community:

  • [ 1 ] [Li, Yingchun]Beijing Univ Technol, Sch Econ & Management, Beijing, Peoples R China
  • [ 2 ] [Ma, Ye]Beijing Univ Technol, Sch Econ & Management, Beijing, Peoples R China
  • [ 3 ] [Peng, Rui]Beijing Univ Technol, Sch Econ & Management, Beijing, Peoples R China
  • [ 4 ] [Gao, Kaiye]Beijing Informat Sci & Technol Univ, Sch Econ & Management, Beijing, Peoples R China

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Source :

2020 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ADVANCED RELIABILITY AND MAINTENANCE MODELING (APARM)

Year: 2020

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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