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Author:

Almaev, A. (Almaev, A..) | Nikolaev, V. (Nikolaev, V..) | Kopyev, V. (Kopyev, V..) | Shapenkov, S. (Shapenkov, S..) | Yakovlev, N. (Yakovlev, N..) | Kushnarev, B. (Kushnarev, B..) | Pechnikov, A. (Pechnikov, A..) | Deng, J. (Deng, J..) | Izaak, T. (Izaak, T..) | Chikiryaka, A. (Chikiryaka, A..) | Scheglov, M. (Scheglov, M..) | Zarichny, A. (Zarichny, A..)

Indexed by:

EI Scopus SCIE

Abstract:

The MSM structures based on high-quality 1.6 μm in thick α-Ga2O3 films grown by the halide vapor phase epitaxy with Ti/Ni interdigital contacts were developed for detection of short-wave ultraviolet (UVC) radiation. The spectral dependences of responsivity, external quantum efficiency and detectivity of MSM structures based on α-Ga2O3 were studied in the wavelength range of 205-260 nm. The responsivity, the external quantum efficiency and the detectivity are 7.19×104 A×W-1, 3.79×105 arb.un. and 1.12×1018 Hz0.5×cm×W-1, respectively, for structures with an interelectrode distance of 30 μm at an applied voltage of 10 V and exposure to radiation with a wavelength of 235 nm. The high values of the photoelectric characteristics were caused by the manifestation of an internal gain of the photoresponse due to the self-localization of holes in α-Ga2O3. The prospects of researches to develop UVC radiation detectors for wireless UVC communication were shown. IEEE

Keyword:

Sea measurements solar-blind ultraviolet detectors Sensors Epitaxial growth halide vapor phase epitaxy α-Ga2O3 Gallium Films Ocean temperature Detectors

Author Community:

  • [ 1 ] [Almaev A.]Research and Development Centre for Advanced Technologies in Microelectronics, National Research Tomsk State University, Tomsk, Russia
  • [ 2 ] [Nikolaev V.]Perfect Crystals LLC, Saint Petersburg, Russia
  • [ 3 ] [Kopyev V.]Research and Development Centre for Advanced Technologies in Microelectronics, National Research Tomsk State University, Tomsk, Russia
  • [ 4 ] [Shapenkov S.]Ioffe Institute of the Russian Academy of Sciences, Saint Petersburg, Russia
  • [ 5 ] [Yakovlev N.]Research and Development Centre for Advanced Technologies in Microelectronics, National Research Tomsk State University, Tomsk, Russia
  • [ 6 ] [Kushnarev B.]Research and Development Centre for Advanced Technologies in Microelectronics, National Research Tomsk State University, Tomsk, Russia
  • [ 7 ] [Pechnikov A.]Ioffe Institute of the Russian Academy of Sciences, Saint Petersburg, Russia
  • [ 8 ] [Deng J.]Beijing University of Technology, Beijing, China
  • [ 9 ] [Izaak T.]Chemistry Faculty of the National Research Tomsk State University, Tomsk, Russia
  • [ 10 ] [Chikiryaka A.]Ioffe Institute of the Russian Academy of Sciences, Saint Petersburg, Russia
  • [ 11 ] [Scheglov M.]Ioffe Institute of the Russian Academy of Sciences, Saint Petersburg, Russia
  • [ 12 ] [Zarichny A.]Ioffe Institute of the Russian Academy of Sciences, Saint Petersburg, Russia

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Source :

IEEE Sensors Journal

ISSN: 1530-437X

Year: 2023

Issue: 17

Volume: 23

Page: 1-1

4 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:19

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 22

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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