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Author:

Peng, C. (Peng, C..) | Ying, X. (Ying, X..) | ShanQi, S. (ShanQi, S..) | ZiYun, F. (ZiYun, F..)

Indexed by:

EI Scopus SCIE

Abstract:

The nonlinear, time correlation, and non-Gaussian features in data present significant challenges for effective fault detection. While the Gate Recurrent Unit (GRU) network is renowned for its capacity to manage time correlation, it falls short in capturing non-Gaussian features in process data, which can likely lead to suboptimal monitoring results. To address this limitation, the Enhancement Gate Recurrent Unit (ENGRU) is developed to perfect the fault detection accuracy of the network. Specifically, The ENGRU effectively extracts high order statistics information by employing the overcompleted independent component analysis method, thereby augmenting its ability to capture non-Gaussian properties. The extracted features information are then entered into the ENGRU model further to uncover additional hidden features beyond what the GRU can achieve. The ENGRU network, which is built upon the extracted characteristic information, even farther enhances the accuracy of the fault detection. The merits of the proposed model are demonstrated by comparing it with excellent fault detection algorithms on a benchmark platform. © 2023 Elsevier Ltd

Keyword:

Fault detection Enhancement gate recurrent unit network Batch production processes Feature enhancement extraction

Author Community:

  • [ 1 ] [Peng C.]Faculty of Information Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Peng C.]Engineering Research Center of Digital Community, Ministry of Education, Beijing, 100124, China
  • [ 3 ] [Ying X.]Faculty of Information Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Ying X.]Engineering Research Center of Digital Community, Ministry of Education, Beijing, 100124, China
  • [ 5 ] [ShanQi S.]Faculty of Information Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [ZiYun F.]Faculty of Information Technology, Beijing University of Technology, Beijing, 100124, China

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Source :

Expert Systems with Applications

ISSN: 0957-4174

Year: 2024

Volume: 237

8 . 5 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:3

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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