• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
搜索

Author:

An, Tong (An, Tong.) | Chen, Xiaoxuan (Chen, Xiaoxuan.) | Qin, Fei (Qin, Fei.) | Dai, Yanwei (Dai, Yanwei.) | Gong, Yanpeng (Gong, Yanpeng.)

Indexed by:

EI Scopus

Abstract:

In this paper, temperature cycling, random vibration and combined loading tests were conducted on plastic ball grid array assemblies. The fatigue lives, the failure modes of the solder joints and the location of the failed solder joints for single loading and combined loading conditions were compared and analyzed. The results show much earlier solder joint failure for combined loading than that for either temperature cycling or pure vibration loading at room temperature. During temperature cycling and random vibration loading tests, the components at the central region have more failed solder joints than other components. The effect of the component location on the stresses and strains at the solder joints is not significant for combined loading. The primary failure mode is cracking within the bulk solder under temperature cycling, whereas the crack propagation path is along the intermetallic compound (IMC) layer for vibration loading. The solder joints subjected to combined loading exhibit both failure modes that occur for the temperature cycling and the vibration loading conditions. © 2021, Editorial Board of Transactions of the China Welding Institution, Magazine Agency Welding. All right reserved.

Keyword:

Soldering Structural design Cracks Ball grid arrays Soldered joints Elasticity Failure modes

Author Community:

  • [ 1 ] [An, Tong]Institute of Electronics Packaging Technology and Reliability, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [An, Tong]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Chen, Xiaoxuan]Institute of Electronics Packaging Technology and Reliability, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Chen, Xiaoxuan]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Qin, Fei]Institute of Electronics Packaging Technology and Reliability, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Qin, Fei]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 7 ] [Dai, Yanwei]Institute of Electronics Packaging Technology and Reliability, Beijing University of Technology, Beijing; 100124, China
  • [ 8 ] [Dai, Yanwei]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 9 ] [Gong, Yanpeng]Institute of Electronics Packaging Technology and Reliability, Beijing University of Technology, Beijing; 100124, China
  • [ 10 ] [Gong, Yanpeng]Beijing Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

Email:

Show more details

Related Keywords:

Related Article:

Source :

Transactions of the China Welding Institution

ISSN: 0253-360X

Year: 2021

Issue: 9

Volume: 42

Page: 49-54

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

Affiliated Colleges:

Online/Total:431/10625364
Address:BJUT Library(100 Pingleyuan,Chaoyang District,Beijing 100124, China Post Code:100124) Contact Us:010-67392185
Copyright:BJUT Library Technical Support:Beijing Aegean Software Co., Ltd.