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Author:

Sun, Zi-Jian (Sun, Zi-Jian.) | Tang, Jian (Tang, Jian.) | Qiao, Jun-Fei (Qiao, Jun-Fei.)

Indexed by:

EI Scopus

Abstract:

The inherent concept drift characteristics of industrial process data leads to the deterioration of the soft sensor model's performance. Thus, the first problem is to identify drift samples to effectively update the model. Aiming at these problems, a double-window concept drift detection method oriented to the modeling of difficult-to-measure parameters of industrial processes is proposed. First, support vector regression is used in the outlier sample detection window to obtain the outlier samples contained in the real-time process data. Then, the Euclidean distance between the outlier sample and the historical sample set is calculated in the distribution detection window; Next, a test drift index combined with a variety of distribution test methods that can characterize the distribution changes contained in outlier samples is defined, so as to realize effective identification of drift samples. Finally, synthetic and real industrial process data sets are used to verify the effectiveness of the proposed method, which shows better performance than existing methods. © 2021, Editorial Department of Control Theory & Applications South China University of Technology. All right reserved.

Keyword:

Deterioration Statistical tests Statistics

Author Community:

  • [ 1 ] [Sun, Zi-Jian]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Sun, Zi-Jian]Beijing Key Laboratory of Computational Intelligence and Intelligent System, Beijing; 100124, China
  • [ 3 ] [Tang, Jian]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Tang, Jian]Beijing Key Laboratory of Computational Intelligence and Intelligent System, Beijing; 100124, China
  • [ 5 ] [Qiao, Jun-Fei]Faculty of Information Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Qiao, Jun-Fei]Beijing Key Laboratory of Computational Intelligence and Intelligent System, Beijing; 100124, China

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Source :

Control Theory and Applications

ISSN: 1000-8152

Year: 2021

Issue: 12

Volume: 38

Page: 1979-1992

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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