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Author：

He, Cunfu (He, Cunfu.) (Scholars：何存富) | Zheng, Mingfang (Zheng, Mingfang.) | Lv, Yan (Lv, Yan.) (Scholars：吕炎) | Deng, Peng (Deng, Peng.) | Zhao, Huamin (Zhao, Huamin.) | Liu, Xiucheng (Liu, Xiucheng.) | Song, Guorong (Song, Guorong.) | Liu, Zenghua (Liu, Zenghua.) (Scholars：刘增华) | Jiao, Jingpin (Jiao, Jingpin.) (Scholars：焦敬品) | Wu, Bin (Wu, Bin.)

Indexed by：

EI Scopus PKU CSCD

Abstract：

This　paper　gives　an　overview　of　the　development　and　application　of　guided　waves　technique　for　NDT&E　in　recent　30　years.　Firstly,　the　fundamental　concepts　of　guided　waves　propagation　and　their　characteristics　are　explained,　and　the　mechanical　loading　principles　and　mode　selection　principles　for　guided　wave　excitation　is　analyzed　thoroughly.　Secondly,　the　transducer　excitation　method　and　its　apparatus　for　ultrasonic　guided　waves　are　introduced,　then　the　features　and　applications　are　discussed　among　different　excitation　methods.　Thirdly,　ultrasonic　guided　wave　applications　in　plates,　tubes　and　composite　materials　are　described,　meanwhile,　the　time　reversal　and　the　phased　array　method　are　introduced　to　improve　the　capability　of　defect　detection.　Finally,　the　challenges　and　opportunities　in　of　guided　ultrasonic　waves　in　future　are　outlined.　©　2016,　Science　Press.　All　right　reserved.

Keyword：

Nondestructive examination Ultrasonic testing Glass ceramics Antenna phased arrays Guided electromagnetic wave propagation Dispersion (waves) Defects Ultrasonic waves

Author Community：

  • [ 1 ] [He, Cunfu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Zheng, Mingfang]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Lv, Yan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Deng, Peng]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Zhao, Huamin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 6 ] [Liu, Xiucheng]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 7 ] [Song, Guorong]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 8 ] [Liu, Zenghua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 9 ] [Jiao, Jingpin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China
  • [ 10 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address：

  • 吕炎

    [lv, yan]college of mechanical engineering and applied electronics technology, beijing university of technology, beijing; 100124, china

Email：


lvyan@bjut.edu.cn
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Source ：

Chinese Journal of Scientific Instrument

ISSN： 0254-3087

Year： 2016

Issue： 8

Volume： 37

Page： 1713-1735

Cited Count：

WoS CC Cited Count： 0

SCOPUS Cited Count：

ESI Highly Cited Papers on the List： 0 Unfold All

WanFang Cited Count：

Chinese Cited Count：

30 Days PV： 14

Affiliated Colleges：

材料科学与工程学院 本学院/部未明确归属的数据

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