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Author:

Chang, Pengying (Chang, Pengying.) | Guo, Yirong (Guo, Yirong.) | Li, Jie (Li, Jie.) | Xie, Yiyang (Xie, Yiyang.)

Indexed by:

EI

Abstract:

The hafnium oxide (HfO2) based ferroelectric tunnel junction (FTJ) using ferroelectric-dielectric (FE-DE) bilayer-barrier structure is studied by physical modeling. The FTJ performance strongly depends on the barrier height of DE with respect to that of FE-HfO2. Compared with FE-HfO2/SiO2 case, FE-HfO2/Ta2O5 based FTJ shows high ON current (JON) and giant ON/OFF ratio. The underlying physics is to introduce resonant tunneling (RT) by forming a quantum well and to shift resonance peak close to the Fermi level. The switching between the direct tunneling (DT) and RT under different polarization direction leads to an enhanced TER effect. © 2023 The Japan Society of Applied Physics.

Keyword:

Tantalum compounds Tunnel junctions Resonant tunneling Semiconductor quantum wells Hafnium oxides Silicon Ferroelectricity

Author Community:

  • [ 1 ] [Chang, Pengying]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing, China
  • [ 2 ] [Guo, Yirong]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing, China
  • [ 3 ] [Li, Jie]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing, China
  • [ 4 ] [Xie, Yiyang]Beijing University of Technology, Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing, China

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Source :

Year: 2023

Page: 209-212

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 11

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