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Author:

Cui, Lingli (Cui, Lingli.) (Scholars:崔玲丽) | Yan, Long (Yan, Long.) | Zhao, Dezun (Zhao, Dezun.)

Indexed by:

EI Scopus SCIE

Abstract:

Under strong noise, bearing fault-related instantaneous frequency (IF) is difficult to extract by time-frequency analysis (TFA)-based ridge extraction method; hence, the tacholess order tracking is unsuitable for characterizing bearing fault characteristic frequency (FCF). To address the above problem, an IF estimation-based order tracking is developed in this article. The fundamental principle of the developed technique is to obtain the IF through the defined instantaneous frequency estimation operator (IFEO) and recovery factor, and then the initial signal is resampled using the IF to achieve bearing fault diagnosis. Specifically, the IFEO is first defined based on the normalization theory, and then the pseudo signal is obtained by resampling the original signal through the IFEO that can match the frequency-modulated (FM) law of the original signal. Second, the spectra concentration index is constructed to calculate the optimal IFEO. Third, the recovery factor corresponding to the optimal IFEO is calculated by searching the highest peak from the envelope spectrogram of the pseudo signal, and then the IF of the maximum amplitude component is calculated. Finally, based on the IF, the bearing signal is resampled, and the fault characteristic order (FCO) spectrum is obtained to detect the bearing fault type. Analysis results of the simulated and measured bearing signals indicate that the developed technique can accurately predict the IF and detect the bearing fault and has better effectiveness in calculating IF and identifying bearing fault type than the traditional ridge extraction method under strong noise.

Keyword:

Demodulation Vibrations Rolling bearings rolling bearing Transforms Time-frequency analysis Frequency estimation order tracking time-varying rotational speed Chirp Fault detection instantaneous frequency estimation operator (IFEO) recovery factor

Author Community:

  • [ 1 ] [Cui, Lingli]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Yan, Long]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Zhao, Dezun]Beijing Univ Technol, Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China

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Source :

IEEE SENSORS JOURNAL

ISSN: 1530-437X

Year: 2023

Issue: 24

Volume: 23

Page: 30940-30949

4 . 3 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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