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Author:

Yang, Guishuan (Yang, Guishuan.) | Chen, Tao (Chen, Tao.) | Zhang, Zhifeng (Zhang, Zhifeng.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

A novel transparent plate thickness measurement method based on laser triangulation with the light compensation is put forward, and a design of transparent plate thickness measuring device is based on single laser displacement sensor, which is applied to correct the focal plane in excimer laser micromachining of transparent material based on projection lithography. Firstly, the relationship between bending light and transparent plate location based on laser triangulation method is built, and the relationship between displacement of scattering light spot and plate thickness is analyzed. The changing rules of measuring results caused by the distance between transparent plate and scattering base plate and the position change of scattering base plate are also analyzed. Then transparent plate thickness measuring device based on single laser displacement sensor is designed. The relationship between spot migration and transparent plate thickness is tested, and compensation coefficient of polymethyl methacrylate (PMMA) thickness measured by experiments is 0.441. Based on the theoretical analysis and experimental verification, the results show that laser displacement sensor readings are linear relation with thethickness of transparent plate, and the distance between transparent plate and scattering surface has no effect on it. The average absolute error of PMMA plate thickness measurement is less than 0.01mm, and the average relative error is 0.6%, which can meet the precision requirements for processing biochip of PMMA base by the excimer laser (KrF, 248 nm) micromachining system. ©, 2015, Science Press. All right reserved.

Keyword:

Excimer lasers Photolithography Displacement measurement Thickness gages Micromachining Triangulation Biochips Measurement Thickness measurement Plates (structural components) Polymethyl methacrylates

Author Community:

  • [ 1 ] [Yang, Guishuan]Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Chen, Tao]Institute of Laser Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Zhang, Zhifeng]School of Physics & Electronic Engineering, Zhengzhou University of Light Industry, Zhengzhou; Henan; 450002, China

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Source :

Chinese Journal of Lasers

ISSN: 0258-7025

Year: 2015

Issue: 7

Volume: 42

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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