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Author:

Liu, Zeng-Hua (Liu, Zeng-Hua.) (Scholars:刘增华) | Xu, Ying-Zan (Xu, Ying-Zan.) | He, Cun-Fu (He, Cun-Fu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.) (Scholars:吴斌)

Indexed by:

EI Scopus PKU CSCD

Abstract:

Lamb wave technology is used for defect detection in plate-like structures. It is easier to interpret received signals and to identify defects if single mode Lamb waves are applied. In this study, piezoelectric transducers are attached, in a form of arrays, on the top and bottom sides of plate. When two piezoelectric transducers at the same locations on each side of the plate are excited by voltage signal simultaneously in phase or out phase, single S0 mode or A0 mode is generated, respectively. In combination with the elliptic imaging algorithm and the data fusion method, single Lamb wave mode can be used for defect imaging for multiple signals received by piezoelectric transducer arrays. The method proposed in this study is effective to obtain two-dimensional images of defects and detect artificial defects in plate-like structures, with improved recognition ability and accuracy.

Keyword:

Ultrasonic waves Piezoelectricity Surface waves Piezoelectric transducers Indium plating Transducers Defects Plates (structural components) Data fusion Image enhancement

Author Community:

  • [ 1 ] [Liu, Zeng-Hua]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Xu, Ying-Zan]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [He, Cun-Fu]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China
  • [ 4 ] [Wu, Bin]College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing 100124, China

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Source :

Engineering Mechanics

ISSN: 1000-4750

Year: 2014

Issue: 4

Volume: 31

Page: 232-238

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 27

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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