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Author:

Yu, J. (Yu, J..) | Li, Y. (Li, Y..) | Zan, T. (Zan, T..) | Peng, J. (Peng, J..) | Liu, W. (Liu, W..) | Lei, Q. (Lei, Q..)

Indexed by:

CPCI-S EI Scopus

Abstract:

As a key factor in the milling process, the wear status of the milling cutter has a significant impact on the machining quality of the workpiece. To detect wear on a milling machine efficiently and precisely, this paper presents the development of a milling machine wear detection system based on machine vision and digital image processing. The system including link mechanisms and industrial camera is designed for auxiliary localization and collection of on-machine images of milling cutter status. The image preprocessing method based on automatic threshold segmentation and Canny edge detection operator is proposed to identify the edge of cutter wear. The Maximum connected domains algorithm is used to screen the wear area of the milling cutter and the amount of wear is obtained based on a calibrated scaling method. Experimental results show that the proposed system is suitable for industrial use due to its rapid detection speed and strong recognition accuracy, which are desirable for engineering applications. ©2024 IEEE.

Keyword:

auxiliary localization mechanism image processing milling cutter wear detection machine vision

Author Community:

  • [ 1 ] [Yu J.]College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China
  • [ 2 ] [Li Y.]College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China
  • [ 3 ] [Zan T.]College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China
  • [ 4 ] [Peng J.]College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China
  • [ 5 ] [Liu W.]College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China
  • [ 6 ] [Lei Q.]College of Beijing-Dublin International, Beijing University of Technology, Beijing, China

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Source :

Year: 2024

Page: 314-318

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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