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Author:

Du, Yihui (Du, Yihui.) | Ji, Xiaoliang (Ji, Xiaoliang.) | Wang, Yishu (Wang, Yishu.) | Guo, Fu (Guo, Fu.) (Scholars:郭福)

Indexed by:

CPCI-S

Abstract:

Since Pb-containing electronic products were banned in 2006, the predominant substitute for Sn-Pb solder was hypoeutectic Sn3.0Ag0.5Cu (SAC305), which has been extensively utilized in contemporary. In recent years, there has been a surge in interest towards Sn-based lead-free composite solder because of their exceptional mechanical properties and service performance. Carbon-based particles, as a reinforcing material, exhibit commendable mechanical and chemical stability, high strength, temperature resistance, and other superior properties. Numerous researchers have utilized nickel as a coating agent to enhance the interfacial compatibility between carbon-based materials and Sn matrix. In this work, we examined the impact of nickel-coated graphite (GR@Ni) and nickel-coated carbon fiber (CF@Ni) on the microstructure and properties of SAC305 solder. The findings revealed that the GR@Ni tended to rise to the surface of the solder owing to a density mismatch with the Sn matrix, thereby leading to a heterogeneous microstructure. The microstructure of the micro-bump was found to contain Ni-Sn intermetallic compounds (IMC), which led to an enhancement in the hardness of the Sn matrix by refining the eutectic Ag3Sn network. In contrast, CF@Ni was uniformly distributed within the micro-bump, resulting in a reduction of similar to 30% in the interfacial IMC thickness and an increase in hardness in the CF@Ni composite solder. However, it was observed that the incorporation of CF@Ni exceeding 4 wt.% resulted in an increase in the thickness of interfacial IMC and a sharp decrease in hardness due to the presence of residual flux-induced pores. Therefore, it is recommended to limit the additional amount of CF@Ni to within the range of 0 similar to 3 wt.%.

Keyword:

properties microstructure SAC305 composite solder

Author Community:

  • [ 1 ] [Du, Yihui]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 2 ] [Ji, Xiaoliang]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 3 ] [Wang, Yishu]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China
  • [ 4 ] [Guo, Fu]Beijing Univ Technol, Fac Mat & Mfg, Beijing, Peoples R China

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Source :

2023 24TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT

ISSN: 2836-9734

Year: 2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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