According　to　the　multi-performance　degradation　of　the　bipolar　transistor　in　the　accelerating　storage　process,　an　extrapolation　model　of　the　storage　lifetime　is　proposed.　In　this　model,　using　the　Wiener　process　simulates　the　mono-degradation　process　of　each　feature　degradation;　using　the　copula　function　describes　the　correlation　among　these　feature　degradations.　The　Wiener　process　and　parameters　in　the　copula　function　are　considered　to　associate　with　the　temperature,　and　their　relationships　can　be　represented　by　the　converted　equations.　Through　the　maximum　likelihood　estimation,　the　parameters　in　the　Wiener　process　can　be　found;　introducing　Kendall＇s　tau,　those　in　the　copula　function　can　be　estimated.　By　conducting　the　regression　analyses　of　the　estimated　values　of　the　parameters　in　each　stress,　their　corresponding　converted　equations　can　be　shown.　Based　on　the　storage　test　data　of　bipolar　transistors,　with　the　estimation　method,　the　storage　lifetime　is　found.　The　findings　show　that　the　model　is　reasonable　for　the　prediction　of　storage　lifetime.　©　2014　Chinese　Institute　of　Electronics.