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Author:

Li, Chun (Li, Chun.) | Gao, Xiaomei (Gao, Xiaomei.) | Deng, Xinyi (Deng, Xinyi.) | Guo, Jiaqi (Guo, Jiaqi.) | Shen, Chao (Shen, Chao.) | Zhang, Qing (Zhang, Qing.)

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EI Scopus SCIE

Abstract:

Radiation-free photonic bound states in the continuum (BIC) in metasurfaces allow ultrahigh quality (Q) factor and strongly confined mode volume, which are extremely advantageous in the development of ultrasensitive microcavity sensors. However, the conventional isolated BICs are susceptible to failure due to symmetry breaking caused by fabrication imperfection and nonzero incident angle. Here, we propose a silicon nitride-based metasurface with multiple BIC merging. The merging of accidental BIC and symmetry-protected BIC can increase the Q-factor near the Brillouin zone Γ point and thus robustly induces a figure of merit (FOM) of refractive index sensing at small incident angles two orders of magnitude higher than that in isolated BIC configuration. Specifically, the FOM in merging BIC reaches 108 at a 2° incident angle. The BIC merging can be universally achieved in square lattices with C4 symmetry, and slower decay of Q-factor and higher FOM can further occur in hexagonal lattices benefiting from higher-order topological charges. The advantage of merging BIC is also maintained when considering in-plane and out-of-plane symmetry breaking. These results offer a unique design path for high-performance metasurface sensors and can be extended to other high-Q applications such as low-threshold lasers, nonlinear frequency conversion, and low-loss waveguides. © 2024 Optica Publishing Group. All rights.

Keyword:

Refractive index Crystal lattices Silicon nitride Crystal symmetry Optical frequency conversion Q factor measurement Microcavities

Author Community:

  • [ 1 ] [Li, Chun]School of Materials Science and Engineering, Peking University, Beijing; 100871, China
  • [ 2 ] [Gao, Xiaomei]State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 3 ] [Gao, Xiaomei]School of Physics and Optoelectronic Engineering, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Deng, Xinyi]School of Materials Science and Engineering, Peking University, Beijing; 100871, China
  • [ 5 ] [Guo, Jiaqi]State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 6 ] [Shen, Chao]State Key Laboratory for Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing; 100083, China
  • [ 7 ] [Shen, Chao]Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing; 100049, China
  • [ 8 ] [Zhang, Qing]School of Materials Science and Engineering, Peking University, Beijing; 100871, China

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Source :

Optics Letters

ISSN: 0146-9592

Year: 2024

Issue: 22

Volume: 49

Page: 6469-6472

3 . 6 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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