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Author:

Misraji, M. (Misraji, M..) | Valdebenito, M. (Valdebenito, M..) | Zhang, X. (Zhang, X..) | Faes, M. (Faes, M..)

Indexed by:

EI

Abstract:

This contribution introduces a novel framework for the first excursion probability sensitivity estimation, applicable to linear dynamic systems subject to a Gaussian excitation. The proposed methodology is based on Domain Decomposition method, and the sensitivity estimator is calculated as the partial derivative of the first excursion probability with respect to a design parameter, such as the geometrical dimensions of the system. The linearity of the system plays a key role in building an efficient estimator. Domain Decomposition Method exploits this feature by exploring the failure domain in a very convenient way due to its special structure, characterized by the union of a large number of elementary linear failure domains. This approach allows the sensitivity estimator to be derived as a byproduct of the first excursion probability estimator. The effectiveness of this technique is demonstrated through a numerical example involving a large-scale model. © 2024 Proceedings of ISMA 2024 - International Conference on Noise and Vibration Engineering and USD 2024 - International Conference on Uncertainty in Structural Dynamics. All rights reserved.

Keyword:

Structural dynamics Gaussian noise (electronic) Sensitivity analysis Uncertainty analysis Risk assessment

Author Community:

  • [ 1 ] [Misraji, M.]TU Dortmund University, Leonhard-Euler-Strasse 5, Dortmund; 44227, Germany
  • [ 2 ] [Valdebenito, M.]TU Dortmund University, Leonhard-Euler-Strasse 5, Dortmund; 44227, Germany
  • [ 3 ] [Zhang, X.]TU Dortmund University, Leonhard-Euler-Strasse 5, Dortmund; 44227, Germany
  • [ 4 ] [Zhang, X.]Beijing University of Technology, National Key Laboratory of Bridge Safety and Resilience, Beijing; 100124, China
  • [ 5 ] [Faes, M.]TU Dortmund University, Leonhard-Euler-Strasse 5, Dortmund; 44227, Germany

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Year: 2024

Page: 4443-4454

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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