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Author:

Qiang, Zhipeng (Qiang, Zhipeng.) | Peng, Li (Peng, Li.) | Wu, Bin (Wu, Bin.) | Wang, Nan (Wang, Nan.) | Wang, Yujue (Wang, Yujue.) | Li, Guangyong (Li, Guangyong.) | Liu, Xiucheng (Liu, Xiucheng.) (Scholars:刘秀成)

Indexed by:

EI Scopus SCIE

Abstract:

Magnetic Barkhausen noise (MBN) is a useful signal for non-destructively characterizing various properties of ferromagnetic materials. It is suggested that MBN is mainly generated at grain boundaries because there are more pinning sites around grain boundaries. However, direct experimental proof is difficult because of the lack of high-spatial-resolution MBN sensor. This study focuses on examining MBN around grain boundaries using a custom-made high-spatial-resolution MBN sensor. Firstly, the magnetic domains and grain structure of an electrical steel were obtained using a magneto-optical Kerr effect microscope. Then, MBN signals inside grains and around grain boundaries were measured using the high-spatial-resolution MBN sensor. The experimental results reveal that MBN signals are more evident around grain boundaries, 32.5%-435.7% larger than that in the grain interior. Based on the experimental measurement, two-dimensional MBN mapping of the area containing grain boundaries was carried out, enabling the identification of the location of grain boundaries in millimeter-scale grains.

Keyword:

microstructure grain boundary magnetic Barkhausen noise high-spatial-resolution sensor two-dimensional magnetic mapping

Author Community:

  • [ 1 ] [Qiang, Zhipeng]Beijing Univ Technol, Coll Mech & Energy Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Nan]Beijing Univ Technol, Coll Mech & Energy Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Peng, Li]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Wu, Bin]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Wang, Yujue]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Liu, Xiucheng]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China
  • [ 7 ] [Li, Guangyong]Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15261 USA

Reprint Author's Address:

  • 刘秀成

    [Peng, Li]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China;;[Liu, Xiucheng]Beijing Univ Technol, Sch Informat Sci & Technol, Beijing 100124, Peoples R China;;[Li, Guangyong]Univ Pittsburgh, Dept Elect & Comp Engn, Pittsburgh, PA 15261 USA

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Source :

MEASUREMENT SCIENCE AND TECHNOLOGY

ISSN: 0957-0233

Year: 2025

Issue: 2

Volume: 36

2 . 4 0 0

JCR@2022

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 8

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