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Author:

Zhu, Yonghuai (Zhu, Yonghuai.) | Zhou, Xiaoya (Zhou, Xiaoya.) | Cheng, Jiangfeng (Cheng, Jiangfeng.) | Liu, Zhifeng (Liu, Zhifeng.) | Zou, Xiaofu (Zou, Xiaofu.) | Cheng, Qiang (Cheng, Qiang.) (Scholars:程强) | Xu, Hui (Xu, Hui.) | Wang, Yong (Wang, Yong.) | Tao, Fei (Tao, Fei.)

Indexed by:

EI Scopus SCIE

Abstract:

Various remaining useful life (RUL) prediction methods, encompassing model-based, data-driven, and hybrid methods, have been developed and successfully applied to prognostics and health management for diverse rolling bearing. Hybrid methods that integrate the merits of model-based and data-driven methods have garnered significant attention. However, the effective integration of the two methods to address the randomness in rolling bearing full life cycle processes remains a significant challenge. To overcome the challenge, this paper proposes a data and model synergy-driven RUL prediction framework that includes two data and model synergy strategies. First, a convolutional stacked bidirectional long short-term memory network with temporal attention mechanism is established to construct Health Index (HI). The RUL prediction is achieved based on HI and polynomial model. Second, a three-phase degradation model based on the Wiener process is developed by considering the evolutionary pattern of different degradation phases. Then, two synergy strategies are designed. Strategy 1: HI is adopted as the observation value for online updating of physics degradation model parameters under Bayesian framework, and the RUL prediction results are obtained from the physics degradation model. Strategy 2: The RUL prediction results from the data-driven and physics-based model are weighted linearly combined to improve the overall prediction accuracy. The effectiveness of the proposed model is verified using two bearing full life cycle datasets. The results indicate that the proposed approach can accommodate both short-term and long-term RUL predictions, outperforming state-of-the-art single models.

Keyword:

health indicator remaining useful life prediction Wiener process and diagnostics sensing monitoring plant engineering and maintenance data and model synergy

Author Community:

  • [ 1 ] [Zhu, Yonghuai]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing Key Lab Adv Mfg Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Zhou, Xiaoya]Aerosp Syst Engn Inst, Digital Overall Design Dept, Beijing 100076, Peoples R China
  • [ 3 ] [Cheng, Jiangfeng]Beihang Univ, Sch Automat Sci & Elect Engn, Beijing 100191, Peoples R China
  • [ 4 ] [Liu, Zhifeng]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Liu, Zhifeng]Jilin Univ, Key Lab CNC Equipment Reliabil, Key Lab Adv Mfg & Intelligent Technologyfor High E, Minist Educ, Changchun 130025, Jilin, Peoples R China
  • [ 6 ] [Zou, Xiaofu]Beihang Univ, Inst Artificial Intelligence, Beijing 100191, Peoples R China
  • [ 7 ] [Cheng, Qiang]Beijing Univ Technol, Beijing Key Lab Adv Mfg Technol, Machinery Ind Key Lab Heavy Machine Tool Digital D, Beijing 100124, Peoples R China
  • [ 8 ] [Xu, Hui]RIAMB Beijing Technol Dev Co Ltd RTD, Beijing 100120, Peoples R China
  • [ 9 ] [Wang, Yong]RIAMB Beijing Technol Dev Co Ltd RTD, Beijing 100120, Peoples R China
  • [ 10 ] [Tao, Fei]Beihang Univ, Int Res Inst Multidisciplinary Sci, Digital Twin Res Ctr, State Key Lab Virtual Real Technol & Syst, XueYuan Rd 37, Beijing 100191, Peoples R China

Reprint Author's Address:

  • [Cheng, Jiangfeng]Beihang Univ, Sch Automat Sci & Elect Engn, Beijing 100191, Peoples R China;;[Liu, Zhifeng]Beijing Univ Technol, Inst Adv Mfg & Intelligent Technol, Beijing 100124, Peoples R China;;[Liu, Zhifeng]Jilin Univ, Key Lab CNC Equipment Reliabil, Key Lab Adv Mfg & Intelligent Technologyfor High E, Minist Educ, Changchun 130025, Jilin, Peoples R China

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Source :

JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME

ISSN: 1087-1357

Year: 2025

Issue: 4

Volume: 147

4 . 0 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 9

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