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Author:

Wang, Zhen (Wang, Zhen.) | Liu, Yan (Liu, Yan.)

Indexed by:

EI Scopus SCIE

Abstract:

Electronic devices play an extremely important role in the aerospace field. Aluminum nitride (AlN) is a promising ceramic material for high-reliability electronic packaging structures that are subjected to impact loads during service. Quasi-static and dynamic flexural tests were conducted to determine the rate-dependent flexural strengths of AlN ceramics. The impact response of the AlN substrates was investigated using experimental tests and a smeared fixed-crack numerical model. The critical velocity of the impactor and the failure mode of the ceramic plate can be accurately predicted using the Drucker-Prager criterion with the scaled fracture-strength parameter. The radial cracks on the ceramic plate upon impact were well reproduced via the proposed novel numerical technique, showing better accuracy compared to the widely used Johnson-Holmquist II (JH-2) model. The effect of impactor nose shape and deflection angles were further investigated to better illustrate the low-velocity impact response of AlN ceramic substrates. Based on the dynamic flexural-strength testing results, this study achieves the prediction of low-speed impact response for AlN ceramic structures, thereby providing technical support for the impact reliability analysis of aerospace ceramic-packaging devices.

Keyword:

impact loading smeared fixed-crack model parametric study scaled strength aluminum nitride

Author Community:

  • [ 1 ] [Wang, Zhen]Beijing Univ Technol, Inst Elect Packaging Technol & Reliabil, Dept Mech, Beijing 100124, Peoples R China
  • [ 2 ] [Liu, Yan]Shenzhen Univ, Coll Phys & Optoelect Engn, Shenzhen 518060, Peoples R China

Reprint Author's Address:

  • [Liu, Yan]Shenzhen Univ, Coll Phys & Optoelect Engn, Shenzhen 518060, Peoples R China

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Related Keywords:

Source :

AEROSPACE

Year: 2025

Issue: 3

Volume: 12

2 . 6 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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