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Author:

Cai, W. (Cai, W..) | Zhao, D. (Zhao, D..) | Wang, T. (Wang, T..)

Indexed by:

Scopus

Abstract:

In engineering, labeled data acquired from bearings is extremely scarce due to its high cost. Most intelligent diagnostic methods struggle to learn sample relationships and perform poorly without sufficient labeled samples. To address the decline in accuracy for bearing fault diagnosis with limited labeled data and make full use of both fault information from unlabeled data and class information from labeled data, a spatial–temporal graph attention contrastive learning (STGACL) is developed in this study. In the STGACL, a triplet-channel graph construction method is first designed to generate the original graph for semi-supervised learning, along with positive and negative graphs for unsupervised learning, and to apply label propagation for the utilization of class information from labeled data. Second, a spatial–temporal similar graph attention network is constructed as the backbone network to initially extract graph representations, where the gated convolution captures temporal correlations, and the similar graph attention layer is employed for spatial information and more similar nodes. Finally, graph contrastive learning is proposed to deeply capture additional informative features from unlabeled samples, and a new loss function based on positive and negative losses fosters the model to fully utilize limited labeled samples. The STGACL achieves the accuracy of 98.07 % and 93.88 % on the aero-engine bearing and planet bearing datasets with a single training label, surpassing five state-of-the-art methods. These results highlight that the STGACL excels in fault diagnosis for limited labeled data, with promising engineering applications. © 2025 Elsevier Ltd

Keyword:

Bearing fault diagnosis Semi-supervised learning Graph attention network Limited labeled samples

Author Community:

  • [ 1 ] [Cai W.]Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Zhao D.]Key Laboratory of Advanced Manufacturing Technology, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Zhao D.]Beijing Engineering Research Center of Precision Measurement Technology and Instruments, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Wang T.]Department of Mechanical Engineering, Tsinghua University, Beijing, 100084, China

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Source :

Computers and Industrial Engineering

ISSN: 0360-8352

Year: 2025

Volume: 204

7 . 9 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 7

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